This paper presents an innovative solution for enhancing atomic force microscopy (AFM) through the development of an open-source high-speed controller. This controller significantly lowers the cost and complexity of AFM systems while enabling high-speed imaging, making it accessible for a wider range of applications in research, particularly in the field of biological sciences. The controller is designed to facilitate nanoscale imaging, which is essential for studies such as assessing skin nanotextures and other biological samples.
Key Features
Open Source Community Support: By being open-source, it encourages collaboration and sharing of improvements among users, fostering innovation in the field.
Cost-Effective Solution: The open-source controller allows researchers to utilize high-speed AFM without the substantial financial burden typically associated with commercial systems.
High-Speed Imaging: Capable of achieving imaging speeds that are competitive with more expensive commercial systems, the controller enhances productivity in nanoscale research.
User-Friendly Design: The system is designed for ease of use and adaptability, allowing researchers to customize and modify the setup according to their specific needs.
Wide Application Range: This technology is applicable not only in academic research but also in various industries where nanoscale imaging is critical.
